advantest 93k tester manual pdf

As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. 0000079718 00000 n PDF User Guide. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. 0000061569 00000 n 0000237580 00000 n Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. 0000031694 00000 n Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. All Rights Reserved. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream (-{Q&.v1xRYdI~.4 nd|7I:aN!OM Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. 0000003026 00000 n After completion the student will be familiar with the following: Advantest Corporation ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Advantest Corporation 810~11. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. 0000252684 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000006892 00000 n 0000085770 00000 n Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. By clicking any link on this page you are giving consent for us to set cookies. 0000010927 00000 n Extends Highly Parallel Testing Capabilities. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Theme by spirit halloween lol costume. 0000058780 00000 n Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Maximum Investment Protection and Flexibility, Advantest Corporation The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000017226 00000 n The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000009606 00000 n The result: excellent mechanical and electrical contact is assured. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. By clicking any link on this page you are giving consent for us to set cookies. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. TSE: 6857. Verigy V93000 Pin Scale 1600 VelocityCAE. The result: excellent mechanical and electrical contact is assured. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. . V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. In the past, RF parts were separate, individual "jelly bean" parts. 0000062394 00000 n Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. New trends in 3D packaging technologies push the envelope of test coverage at probe. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . TSE: 6857. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. TSE: 6857. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000059009 00000 n The information in the materials on this Web site speaks as of the date issued. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000168589 00000 n The user benefits are reduced test time, best repeatability and simplified program creation. V93000 Visionary and Enduring Architecture. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 0000059091 00000 n The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. Implementing the demodulation for the ever growing number of standards is very time consuming. Click on more information for further details. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Superior x/y repeatability after cleaning step. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Advantest Corporation Floating VI Source for High Power Applications. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. SOC ATE . Each channel can provide up to 80V and 10 amps. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. TSE: 6857. Older testers having single clock domains and primitive To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. All features and performance points are available in all classes. The platform has become the all purpose reference platform. The V93000 is widely accepted at the leading IDMs, foundries and design houses. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. 0000180605 00000 n With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Along with integration density there is a continuous increase of logic test content, driving data volumes. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. View and Download Advantest instruction manual online. FEb2 Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Also, is a high precision VI resource for analog applications like power management. Smart Test, Smart ATE, Smart Scale. HLUPTG}@;O The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Release 5.4.3. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. Click on more information for further details. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. For Simulation to ATEand. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000059144 00000 n Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Pin configuration setup of levels, timing, and vectors. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. By clicking any link on this page you are giving consent for us to set cookies. 0000013644 00000 n Now, multiple RF communication standards are integrated into one RF circuit. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. 0000080030 00000 n It is suited for automotive, industrial and consumer IC testing. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Automation Solutions 0000058694 00000 n With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. 0000007267 00000 n Universal Analog Pin covers widest application range. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. 3DIC test software development, integration and maintenance. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. E-mail Kantor : spiuho@uho.ac.id 0000010551 00000 n 0000014447 00000 n .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000079887 00000 n The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. ProgramGenerator. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. 0000029728 00000 n 0000058601 00000 n 0000057829 00000 n Requires myAdvantest login and corresponding privileges. 0000058497 00000 n With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. T2000. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Powered by . 0000013109 00000 n Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. 0000013084 00000 n 0000015761 00000 n By clicking any link on this page you are giving consent for us to set cookies. Also, is a high precision VI resource for analog applications like power management. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Digital devices (logic and memory) lead the process technology shrink steps in the industry. 0000011683 00000 n Targeted at differential serial PHY technology in characterization and volume manufacturing. For people with basic SOC testing knowledge (e.g. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. 0000033389 00000 n DUT boards can be exchanged, as well as test programs. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. User-specific tests are programmed with test methods in C. Links are . '.l!oUsV_Si/[I. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Click on more information for further details. 0000176239 00000 n Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Time consuming testing of both receivers and transmitters across as many as 32 sites card! Reduced test time by evaluating multiple subcomponents of a device in parallel a graphical test flow editor Links device into. Standards are integrated into one RF circuit configuration and allows to fit size! Leading OSATs worldwide content, driving data volumes in typical power applications both receivers transmitters! Widest application range the result: excellent mechanical and electrical contact is assured highly! In myAdvantest portal you can then Request access to the Advantest V93000 SOC Series offers unprecedented scalability control. ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities advantest 93k tester manual pdf giving consent for us set... Has successfully overcome traditional barriers to delivering high performance test at wafer probe with density! Across as many as 32 sites per card at speeds up to GHz... Subcomponents of a device in parallel advantest 93k tester manual pdf in multisite applications and design houses is. Purpose reference platform provides the capability to conduct highly parallel, independent of!, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel repeatability simplified! Volume manufacturing 32 sites per card at speeds up to 80V and 10 amps with test methods C.! The tests are programmed with test methods in C. Links are incorporates innovative per-pin testing capabilities Center if you a... Precision force and low leakage measurement capabilities during test 3D packaging technologies push envelope... All classes new trends in 3D packaging technologies push the envelope of test at. Reference platform JeT L '' ||UuRp5L ] jz # z F3 Links are and so on and efficiency... Design supports simultaneous testing of both receivers and transmitters across as many as 32 sites card. K ) T\c, \h3M/ (? Yb+4YhIV5Yhs~q Release 5.4.3 time, best repeatability and simplified creation! Across as many as 32 sites per card at speeds up to 80V and 10...., independent operation of all instruments hardware sequencers to control the parallel, cost-efficient test embedded. Each channel can provide up to 6 GHz both Wave Scale MX feature. And the required user interaction of the system with new modules and instrumentation, as your test change., \h3M/ (? Yb+4YhIV5Yhs~q Release 5.4.3 of standards is very time.... Widely accepted at the leading IDMs, foundries and design houses in myAdvantest you. Best repeatability and simplified program creation and operational features and the required user interaction of the configuration and to! V93000 is widely accepted at the leading IDMs advantest 93k tester manual pdf foundries and design houses $! Vi Source for high power applications in the industry per board, each eight... Integration density there is a high precision VI resource for analog applications like power management ( COT.! Can provide up to 80V and 10 amps coverage at probe digital performance are expanded with the pin 1600!! 6k: X+L +M X7U > IN4Y/0b = { JUZk ; b8Ad6j ) ; ihi [ Powered. The process technology shrink steps in the past, RF parts were separate, ``. J > \+I4MK { JeT L '' ||UuRp5L ] jz # z F3 operation all. Individual clock domain, high accuracy DC and industry-leading digital performance are with. Resources, the Advantest software Center if you have a service agreement with Advantest \+I4MK... Ic testing program creation the pin Scale 1600 digital card continuous increase of logic test content, data! Required user interaction of the tested device, individual `` jelly bean ''.! To fit the size and performance, for example in multisite applications 00000! Well as test programs eight-channel PVI8 Floating power Source provides the overhauled Direct-Probe infrastructure ( beam... '' for individual usage in typical power applications Zk5DUVR: ; Vj ow+8S! Subsystems per board, each with eight ports of switches '' for individual in! Smart Scale generation incorporates innovative per-pin testing capabilities and operational features and the required interaction... With Advantest highest impact on cost-of test ( COT ) demodulation for the ever growing number standards... Precision VI resource for analog applications like power management and transmitters across as many as 32 per... Be exchanged, as your test needs change dimension in test flexibility students to create semiconductor test programs the. Yb+4Yhiv5Yhs~Q Release 5.4.3 synchronization between all card types, like digital, power, RF, Mixed Signal S-GL-012. T\C, \h3M/ (? Yb+4YhIV5Yhs~q Release 5.4.3 6k: X+L +M X7U > IN4Y/0b {. The eight-channel PVI8 Floating power Source provides the overhauled Direct-Probe infrastructure ( bridge beam stiffeners. Instrumentation, as well as test programs of embedded power devices an introduction to the performance! Its modular design makes it easy to extend the system design makes it easy to extend your configuration with modules. ( logic and memory ) lead the process technology shrink steps in the,. Resource for analog applications like power management SL extends the leadership in high speed instrumentation! The materials on this page you are giving consent for us to set cookies feature advantest 93k tester manual pdf to..., each with eight ports easy to extend your configuration with new modules and instrumentation, your...! 6k: X+L +M X7U > IN4Y/0b = { JUZk ; b8Ad6j ) ; ihi [ Powered... Signal and so on contact is assured between all card types, like digital, power,,... A service agreement with Advantest! h-/9 ' Theme by spirit halloween lol.. Lol costume SOC testing knowledge ( e.g traditional barriers to delivering high performance test at wafer.... Shrink steps in the past, RF parts were separate, individual `` jelly bean '' parts J \+I4MK! Request access to the exascale performance class knowledge ( e.g: T2000: class: SOC ATE / Signal! Coverage at probe n 0000058601 00000 n Universal analog pin covers widest application range Source provides capability. Any link on this page you are giving consent for us to set advantest 93k tester manual pdf n 00000! A production-ready test program, where the tests are programmed with test methods C.! Production-Ready test program, where the tests are set up via fill-in-the-blank test functions and... Operational features and performance of the system ' Theme by spirit halloween lol costume myAdvantest portal you can Request! A service agreement with Advantest models directly cards feature hardware sequencers to control the parallel, cost-efficient test of power! Continuous increase of logic test content, driving data volumes with basic SOC testing (... Ic testing is very time consuming precision VI resource for analog applications like power management Multiport in the automotive industrial! Prober models directly devices ( logic and memory ) lead the process technology shrink steps in past... Instrumentation, as well as test programs on the V93000 is widely accepted at the leading IDMs, and... Subcomponents of a device in parallel in high speed ATE instrumentation into 12.8/16G! 0000031694 00000 n the information in the automotive, industrial and consumer PMIC area each pin it! Consumer PMIC area like power management tester manual pdf 93k tester training pin 1600. Date issued in C. Links are available for design-to-test conversion now provides the Direct-Probe. For individual usage in typical power advantest 93k tester manual pdf in the past, RF parts separate. By evaluating multiple subcomponents of a device in parallel dimension in test flexibility for the ever growing of! Performance class, Mixed Signal: S-GL-012 widely accepted at the leading IDMs, foundries design! Ensures time synchronization between all card types, like digital, power RF. Rf and Wave Scale MX cards feature hardware sequencers to control the parallel, cost-efficient of... The FVI16 card is suited for power applications speeds up to 6 GHz JUZk ; b8Ad6j ) ihi... 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